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Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

Guangdong Bell Experiment Equipment Co., Ltd
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Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

Brand Name : DGBELL

Model Number : BTG-072 / BTG-125 / BTG-270 / BTG-600 / BTG-1000

Certification : ISO-9001:2015

Place of Origin : China

MOQ : 1

Payment Terms : L/C, D/A, D/P, T/T

Supply Ability : 5000+ sets

Packaging Details : Each set protected with resin fiber and PP film, then put into Strong wooden case with operation manual inside.

Color : As Picture

Strengths : Customizable

Temp. Range : Rt-250℃ (Optional for 500℃)

Temp. Fluctuation : ≤±0.5

Temp. Deviation : ≤±1.5℃

Temp. Uniformity : ≤±1℃

Display : TFT LCD

Input : Compatible for wet-dry bulbs PT100(T/C,RTD,DCV)

Accuracy : 0.01% high precision sampling

System Capacity : 10 programs, 100 segments for each program

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Universal Burn in Test Machine High Temperature Accelerated Aging Test Chamber For Laptop Battery

 

Applications

 

DGBELL's burn-in chamber is widely applied to electronic and electric products, components and materials by constant high low temperature, temperature shock and rapid temperature change reliability test.

 

Features

 

With high precision perfect external design, external with double sides cold rolled plate electrostatic powder coated material, internal with SUS#304 high temperature resistant stainless steel. Insulation material adopts fire resistant high strength glass fiber thermal insulating material. The Control system and control circuit all introduced with the famous brand.

 

Performance parameters

 

  Temp. Range

 

  Rt-250℃ (Optional for 500℃)

  Temp. Fluctuation

 

  ≤±0.5

  Temp. Deviation

 

  ≤±1.5℃

  Temp. Uniformity

 

  ≤±1℃

 

 

Controller(Korea TEMI 300 programmable controller)

 

   Display

 

  TFT LCD

  Input

 

  Compatible for wet-dry bulbs PT100(T/C,RTD,DCV)

  Accuracy

 

  0.01% high precision sampling

  System Capacity

 

  10 programs, 100 segments for each program

  Operating Mode

 

  Fixed value/ Programmable running mode

  Output Method

 

  PID+SSR/SCR automatic bidirectional synchronous output

  Start pre-set

 

  Equipment starting can be pre-set.

  Communication Interface

 

  compatible for protocols (RS485, Modbus, etc.)

 


Product Tags:

TFT LCD Accelerated Aging Test Chamber

      

Laptop Battery Accelerated Aging Test Chamber

      

TFT LCD Burn In Test Chamber

      
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